Invention Grant
- Patent Title: Method and system for detection of in-panel mura based on hough transform and gaussian fitting
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Application No.: US15974382Application Date: 2018-05-08
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Publication No.: US10740889B2Publication Date: 2020-08-11
- Inventor: Yanxue Wang
- Applicant: HUIZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Huizhou
- Assignee: HUIZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: HUIZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Huizhou
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1db63206
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06T7/13 ; G06T5/00 ; G06T7/136 ; G06T5/40

Abstract:
The present invention provides a method for detection of in-panel mura based on Hough transform and Gaussian function fitting, including: S1. acquiring an original gray-scale image; S2. acquiring a binarized image according to the gray-scale image; S3. performing an edge detection via Hough transform to crop edges of the gray-scale image; and S4. performing histogram statistics on the cropped gray-scale image, fitting the histogram to a Gaussian function, and detecting an in-panel mura result according to the fitting parameters. The present invention is able to determine images of the display region via Hough transform in order to acquire the region for in-panel mura detection, and also evaluate severity of in-panel mura via parameters acquired by Gaussian function fitting, and thus to quickly detecting in-panel mura.
Public/Granted literature
- US20190206043A1 METHOD AND SYSTEM FOR DETECTION OF IN-PANEL MURA BASED ON HOUGH TRANSFORM AND GAUSSIAN FITTING Public/Granted day:2019-07-04
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