Invention Grant
- Patent Title: Dynamic bit line voltage and sensing time enhanced read for data recovery
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Application No.: US16453291Application Date: 2019-06-26
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Publication No.: US10741257B1Publication Date: 2020-08-11
- Inventor: Jianzhi Wu , Xiang Yang
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Dickinson Wright PLLC
- Agent Steven Hurles
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26 ; G11C16/34 ; G11C16/24

Abstract:
A method and system are provided for reading a non-transitory memory array. When a default read operation is performed and has failed, a dynamic sensing bit line voltage (VBLC) enhanced read or a dynamic sense time read is performed. According to the dynamic VBLC enhanced read or the dynamic sense time enhanced read, the VBLC or the sense time is increased, and a read is performed with the increased VBLC or increased sense time. If this enhanced read is unsuccessful, and if a maximum VBLC or a maximum sense time has not yet been reached, the VBLC or the sense time is increased again, and another read is performed. Once the maximum VBLC or a maximum sense time has been reached, if the read is still not successful, a read failure is reported.
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