Invention Grant
- Patent Title: Inspecting device and method for component with two wires
-
Application No.: US16097536Application Date: 2017-04-28
-
Publication No.: US10746535B2Publication Date: 2020-08-18
- Inventor: Yukio Iwasaki , Satoru Hibino , Kazunori Hirata
- Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
- Applicant Address: JP Kobe
- Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
- Current Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
- Current Assignee Address: JP Kobe
- Agency: Oliff PLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5fdf6048
- International Application: PCT/JP2017/017094 WO 20170428
- International Announcement: WO2017/188454 WO 20171102
- Main IPC: G01B11/24
- IPC: G01B11/24 ; H05K13/08 ; G01N21/95 ; G01N21/952

Abstract:
A component inspecting device inspects presence or absence of an abnormal state of two linear wires based on changes in the amount of received light of a first light ray and a second light ray received by a first light receiver and a second light receiver, respectively when a component is moved such that the two linear wires in the normal state block the first light ray and the second light ray in a posture wherein an arrangement direction of the two linear wires crosses optical axes of the first light ray of the first light projector and the second light ray of the second light projector. This device can detect an abnormality such as a bend or the like of linear wires by a simple configuration and a simple operation in a component having two linear wires which have axis directions parallel to each other and have different lengths.
Public/Granted literature
- US20190154436A1 COMPONENT INSPECTING DEVICE AND METHOD Public/Granted day:2019-05-23
Information query