Invention Grant
- Patent Title: Optical displacement meter
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Application No.: US16512467Application Date: 2019-07-16
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Publication No.: US10746536B2Publication Date: 2020-08-18
- Inventor: Yoshitaka Tsuchida
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5fbe85a0
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B11/14

Abstract:
There is provided an optical displacement meter capable of accurately measuring a profile of a measurement object even when multiple reflections are caused. At the time of setting, reference data indicating a reference profile of a measurement object is registered by a registration unit, and a mask region is set to the reference data by a setting unit. At the time of measurement, reflected light from the measurement object is received by a light receiving unit, and a peak in an output light receiving amount distribution is detected by a peak detection unit. Temporary profile data of the measurement object is generated by a profile generation unit based on a position of the detected peak. A position of the mask region for the temporary profile is corrected by a correction unit.
Public/Granted literature
- US20200049490A1 OPTICAL DISPLACEMENT METER Public/Granted day:2020-02-13
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