Invention Grant
- Patent Title: Methods and apparatus for classifying an artifact in a specimen
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Application No.: US16072386Application Date: 2017-01-24
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Publication No.: US10746665B2Publication Date: 2020-08-18
- Inventor: Stefan Kluckner , Yao-Jen Chang , Terrence Chen , Benjamin S. Pollack
- Applicant: Siemens Healthcare Diagnostics Inc.
- Applicant Address: US NY Tarrytown
- Assignee: Siemens Healthcare Diagnostics Inc.
- Current Assignee: Siemens Healthcare Diagnostics Inc.
- Current Assignee Address: US NY Tarrytown
- International Application: PCT/US2017/014767 WO 20170124
- International Announcement: WO2017/132162 WO 20170803
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N21/90 ; G06T7/00 ; G06T7/143 ; G01N35/00 ; G06T7/77 ; G06T7/174 ; G01N21/88 ; G01N35/10

Abstract:
A model-based method of inspecting a specimen for presence of one or more artifacts (e.g., a clot, bubble, and/or foam). The method includes capturing multiple images of the specimen at multiple different exposures and at multiple spectra having different nominal wavelengths, selection of optimally-exposed pixels from the captured images to generate optimally-exposed image data for each spectra, computing statistics of the optimally-exposed pixels to generate statistical data, identifying a serum or plasma portion of the specimen, and classifying, based on the statistical data, whether an artifact is present or absent within the serum or plasma portion. Testing apparatus and quality check modules adapted to carry out the method are described, as are other aspects.
Public/Granted literature
- US20190033230A1 METHODS AND APPARATUS FOR CLASSIFYING AN ARTIFACT IN A SPECIMEN Public/Granted day:2019-01-31
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