Invention Grant
- Patent Title: Parametric pin measurement unit high voltage extension
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Application No.: US15941479Application Date: 2018-03-30
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Publication No.: US10746789B2Publication Date: 2020-08-18
- Inventor: Patrick G. Sullivan
- Applicant: ELEVATE SEMICONDUCTOR, INC.
- Agency: Stainbrook & Stainbrook, LLP
- Agent Craig M. Stainbrook
- Main IPC: G01R31/30
- IPC: G01R31/30 ; G01R19/00 ; G01R31/28

Abstract:
An integrated circuit for measuring a signal, including a parametric pin measurement unit (PPMU) that sends a forced signal, the PPMU having a first amplifier, a second amplifier with an output terminal connected to the input terminals of the first amplifier through a common resistor; a voltage-to-current convertor connected to a PPMU output and having a first output and a second output; n channel MOSFETs connected to the first output of the voltage-to-current converter; p channel MOSFETs connected to the second output of the voltage-to-current converter; a buffered amplifier connected to an output port between the n channel MOSFETs and the p channel MOSFETs; and a resistance divider connected to the output of the buffered amplifier.
Public/Granted literature
- US20180292453A1 PARAMETRIC PIN MEASUREMENT UNIT HIGH VOLTAGE EXTENSION Public/Granted day:2018-10-11
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