Invention Grant
- Patent Title: Test device and method for operating a test device
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Application No.: US15563221Application Date: 2016-05-20
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Publication No.: US10746813B2Publication Date: 2020-08-18
- Inventor: Reinhard Kaufmann , Dirk Flax
- Applicant: OMICRON Electronics GmbH
- Applicant Address: AT Klaus
- Assignee: OMICRON ELECTRONICS GMBH
- Current Assignee: OMICRON ELECTRONICS GMBH
- Current Assignee Address: AT Klaus
- Agency: Preti Flaherty Beliveau & Pachios LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5039f713
- International Application: PCT/EP2016/061401 WO 20160520
- International Announcement: WO2016/202523 WO 20161222
- Main IPC: G01R31/72
- IPC: G01R31/72 ; G01R31/62 ; H02P13/00

Abstract:
A test device is configured for testing a specimen which has an inductor. The test device includes a controllable unit for reducing a current intensity of a current flowing in the inductor.
Public/Granted literature
- US20180088165A1 TEST DEVICE AND METHOD FOR OPERATING A TEST DEVICE Public/Granted day:2018-03-29
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