Embodiments include apparatuses, methods, and systems for testing an IC of an in-vehicle system of a CA/AD vehicle includes a storage device and processing circuitry coupled with the storage device. A gate level fault group is provided to include one or more gate level faults of a fault model associated to a gate level circuit element of the gate level netlist of the IC with substantially same fault controllability or observability characteristics. A correlated RTL fault group is determined to be associated to a RTL circuit node, where the RTL circuit node of the RTL netlist corresponds to the gate level circuit element. Other embodiments may also be described and claimed.