Invention Grant
- Patent Title: Memory sense amplifiers and memory verification methods
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Application No.: US16176390Application Date: 2018-10-31
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Publication No.: US10748613B2Publication Date: 2020-08-18
- Inventor: Makoto Kitagawa , Kerry Tedrow
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MIcron Technology, Inc.
- Current Assignee: MIcron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C7/06 ; G11C11/56

Abstract:
Memory sense amplifiers and memory verification methods are described. According to one aspect, a memory sense amplifier includes a first input coupled with a memory element of a memory cell, wherein the memory element has different memory states at different moments in time, a second input configured to receive a reference signal, modification circuitry configured to provide a data signal at the first input from the memory element having a plurality of different voltages corresponding to respective ones of different memory states of the memory cell at the different moments in time, and comparison circuitry coupled with the modification circuitry and configured to compare the data signal and the reference signal at the different moments in time and to provide an output signal indicative of the memory state of the memory cell at the different moments in time as a result of the comparison to implement a plurality of verify operations of the memory states of the memory cell at the different moments in time.
Public/Granted literature
- US20190066783A1 Memory Sense Amplifiers and Memory Verification Methods Public/Granted day:2019-02-28
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