Invention Grant
- Patent Title: Carrier arrangement and method for processing a carrier by generating a crack structure
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Application No.: US15939921Application Date: 2018-03-29
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Publication No.: US10748801B2Publication Date: 2020-08-18
- Inventor: Gunther Mackh , Markus Brunnbauer , Adolf Koller , Jochen Mueller
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@16add0e3
- Main IPC: H01L21/683
- IPC: H01L21/683 ; H01L29/36 ; H01L21/268 ; H01L21/78

Abstract:
According to various embodiments, a method for processing a carrier may include: forming an arrangement of defects in the carrier, wherein a surface region of the carrier is disposed over the arrangement of defects at a first surface of the carrier, wherein the arrangement of defects is configured to generate a crack structure extending from the arrangement of defects into the surface region; partially removing the carrier to remove the arrangement of defects; and separating the surface region of the carrier into a plurality of surface region portions along the crack structure.
Public/Granted literature
- US20180286735A1 Carrier Arrangement and Method for Processing a Carrier Public/Granted day:2018-10-04
Information query
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