- Patent Title: Inspection apparatus and component mounting system having the same
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Application No.: US15528361Application Date: 2015-11-20
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Publication No.: US10750649B2Publication Date: 2020-08-18
- Inventor: Jeongyeob Kim
- Applicant: KOH YOUNG TECHNOLOGY INC.
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Reed & Houtteman PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@56cbc227 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2afa623c
- International Application: PCT/KR2015/012558 WO 20151120
- International Announcement: WO2016/080809 WO 20160526
- Main IPC: B23K3/08
- IPC: B23K3/08 ; H05K13/08 ; B23K101/42

Abstract:
A component mounting system and a method for inspecting mounted components are provided. A component mounting system according to an embodiment, comprises a solder inspection apparatus comparing coordinate information of the solder, which is obtained through measurement of a substrate to which solder is applied, with reference coordinate information to generate coordinate correction data; and a first mounting inspection apparatus comparing a first measurement data obtained by measuring mounting state of a component when the component is mounted based on the coordination correction data through a component mounting apparatus, with the coordinate correction data to verify whether a component is mounted on a position corrected based on the coordinate correction data. In this manner, by adding the verification function for the performance function of the component mounting apparatus to the inspection apparatus, it is possible to monitor the operation state of the component mounting apparatus in each process step.
Public/Granted literature
- US20170367229A1 INSPECTION APPARATUS AND COMPONENT MOUNTING SYSTEM HAVING THE SAME Public/Granted day:2017-12-21
Information query
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