Invention Grant
- Patent Title: System and method for 3D profile determination using model-based peak selection
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Application No.: US15934766Application Date: 2018-03-23
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Publication No.: US10753726B2Publication Date: 2020-08-25
- Inventor: David Y. Li , Li Sun , Lowell D. Jacobson , Lei Wang
- Applicant: Cognex Corporation
- Applicant Address: US MA Natick
- Assignee: Cognex Corporation
- Current Assignee: Cognex Corporation
- Current Assignee Address: US MA Natick
- Agency: Loginov & Associates, PLLC
- Agent William A. Loginov
- Main IPC: G01B11/03
- IPC: G01B11/03 ; G06T7/521 ; H04N5/235 ; G06T11/00 ; G06T17/00 ; G06T7/593

Abstract:
This invention provides a system and method for selecting the correct profile from a range of peaks generated by analyzing a surface with multiple exposure levels applied at discrete intervals. The cloud of peak information is resolved by comparison to a model profile into a best candidate to represent an accurate representation of the object profile. Illustratively, a displacement sensor projects a line of illumination on the surface and receives reflected light at a sensor assembly at a set exposure level. A processor varies the exposure level setting in a plurality of discrete increments, and stores an image of the reflected light for each of the increments. A determination process combines the stored images and aligns the combined images with respect to a model image. Points from the combined images are selected based upon closeness to the model image to provide a candidate profile of the surface.
Public/Granted literature
- US20190101376A1 SYSTEM AND METHOD FOR 3D PROFILE DETERMINATION USING MODEL-BASED PEAK SELECTION Public/Granted day:2019-04-04
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