Invention Grant
- Patent Title: System and method for line Mura detection with preprocessing
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Application No.: US15956667Application Date: 2018-04-18
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Publication No.: US10755133B2Publication Date: 2020-08-25
- Inventor: Janghwan Lee
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/62 ; G06T17/00 ; H04N7/18 ; G06K9/46 ; G06T7/00 ; G09G3/00

Abstract:
A system and method for identifying line Mura defects on a display. The system is configured to generate a filtered image by preprocessing an input image of a display using at least one filter. The system then identifies line Mura candidates by converting the filtered image to a binary image, counting line components along a slope in the binary image, and marking a potential candidate location when the line components along the slope exceed a line threshold. Image patches are then generated with the candidate locations at the center of each image patch. The image patches are then classified using a machine learning classifier.
Public/Granted literature
- US20190258890A1 SYSTEM AND METHOD FOR LINE MURA DETECTION WITH PREPROCESSING Public/Granted day:2019-08-22
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