Invention Grant
- Patent Title: Work management apparatus, work defect prevention program, and work defect prevention method
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Application No.: US15318094Application Date: 2014-06-13
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Publication No.: US10755222B2Publication Date: 2020-08-25
- Inventor: Kentarou Oonishi , Daisuke Katsumata , Tooru Sugimoto , Naoto Murayama , Nobuhiro Ihori , Naoto Miyao , Takayuki Fujiwara , Shinya Iguchi , Hiroaki Takatsuki
- Applicant: Hitachi Systems, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi Systems, Ltd.
- Current Assignee: Hitachi Systems, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2014/065780 WO 20140613
- International Announcement: WO2015/189995 WO 20151217
- Main IPC: G06Q10/06
- IPC: G06Q10/06 ; G06K9/00
Abstract:
Provided is a technology for supporting work carried out under a unique work environment. A work management apparatus includes: an image reception unit configured to receive an image from another apparatus; an instruction target specification unit configured to specify a device instructed by a predetermined instruction method in the received image; and a display instruction unit configured to instruct the another apparatus to display the device specified by the instruction target specification unit in a different display mode from a display mode of another device contained in the image.
Public/Granted literature
- US20170132554A1 Work Management Apparatus, Work Defect Prevention Program, and Work Defect Prevention Method Public/Granted day:2017-05-11
Information query
