- Patent Title: Memory device that performs a read operation and a test operation
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Application No.: US16283655Application Date: 2019-02-22
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Publication No.: US10755752B2Publication Date: 2020-08-25
- Inventor: Ryousuke Takizawa
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Tokyo
- Agency: Kim & Stewart LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@9689f42
- Main IPC: G11C7/08
- IPC: G11C7/08 ; G11C11/16

Abstract:
A memory device includes a first sense amplifier, and a second sense amplifier. During a read operation, a first signal based on a first output of the first sense amplifier corresponding to data stored in a memory cell before writing reference data therein and a second signal based on a second output of the first sense amplifier corresponding to data stored in the memory cell after writing reference data therein, are supplied to the second sense amplifier, which compares the first and second signals to output a comparison result representative of the data stored in the memory cell. During a test operation, a third signal based on the first output and a fourth signal based on an output from a voltage supply circuit are supplied to the second sense amplifier, which outputs a comparison result of the third and fourth signals as a test result.
Public/Granted literature
- US20200020365A1 MEMORY DEVICE Public/Granted day:2020-01-16
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