Invention Grant
- Patent Title: Inspection system
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Application No.: US16171583Application Date: 2018-10-26
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Publication No.: US10759057B2Publication Date: 2020-09-01
- Inventor: Kazuma Hiraguri , Hiroaki Kuwahara
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@65b43a6e
- Main IPC: G01R31/34
- IPC: G01R31/34 ; H02K15/02 ; G01B5/14 ; B25J9/16 ; G01N27/90 ; G01B7/14 ; H02K15/00 ; G01B11/14

Abstract:
According to one embodiment, an inspection system inspects equipment including a first structural object and a second structural object. The first structural object extends in a first direction. The second structural object is provided around the first structural object. The second structural object has a first surface opposing the first structural object. A first protrusion is provided in the first surface. The first protrusion extends in the first direction. The system includes a robot and a controller. The robot includes an imager. The robot moves between the first structural object and the second structural object. The imager images the first protrusion. The controller detects, from a first image acquired by the imager, a first edge portion of the first protrusion in a circumferential direction around the first direction. The controller controls a movement of the robot by using the detected first edge portion.
Public/Granted literature
- US20190126486A1 INSPECTION SYSTEM Public/Granted day:2019-05-02
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