Each of a first electrode pattern Ty and a second electrode pattern Tx extends between third electrodes Rx neighboring in a Y direction among the plurality of third electrodes Rx so as to overlap only partly with each of the neighboring third electrodes Rx in a plan view. A microcontroller is configured to detect capacitance generated at those portions. The microcontroller is configured to calculate shear force based on a capacitance change obtained due to a change in an overlapping surface area between the third electrode Rx and the first electrode pattern Ty and the second electrode pattern Tx overlapping each other in a plan view, when a pressure is applied so that an insulator is deformed.