Invention Grant
- Patent Title: Methods and systems for characterizing void fractions
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Application No.: US16410592Application Date: 2019-05-13
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Publication No.: US10761042B2Publication Date: 2020-09-01
- Inventor: Michel De Paepe , Kathleen De Kerpel , Hugo Caniere
- Applicant: UNIVERSITEIT GENT
- Applicant Address: BE Ghent
- Assignee: UNIVERSITEIT GENT
- Current Assignee: UNIVERSITEIT GENT
- Current Assignee Address: BE Ghent
- Agency: Workman Nydegger
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1a29f0f8
- Main IPC: G01N27/22
- IPC: G01N27/22 ; G01N33/28 ; F28F27/02 ; G01N33/00 ; G01N33/26 ; G01N27/02
Abstract:
The present invention relates to a method and system for determining the void fraction of a multi-phase system in a channel. The method comprises the steps of measuring a void fraction dependent parameter of the multi-phase system, obtaining a flow regime of the multi-phase system, and determining the void fraction of the multi-phase system taking into account a set of one or more relationships between the void fraction dependent parameter and the void fraction, the set of relationships being specific for the obtained flow regime.
Public/Granted literature
- US20190277788A1 METHODS AND SYSTEMS FOR CHARACTERIZING VOID FRACTIONS Public/Granted day:2019-09-12
Information query
