Invention Grant
- Patent Title: Electro-optic probe, electromagnetic wave measuring apparatus, and electromagnetic wave measuring method
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Application No.: US15740225Application Date: 2016-06-28
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Publication No.: US10761126B2Publication Date: 2020-09-01
- Inventor: Shintarou Hisatake , Tadao Nagatsuma , Hirohisa Uchida
- Applicant: OSAKA UNIVERSITY
- Applicant Address: JP Osaka
- Assignee: Osaka University
- Current Assignee: Osaka University
- Current Assignee Address: JP Osaka
- Agency: Morgan, Lewis & Bockius LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3e75b4c1
- International Application: PCT/JP2016/069076 WO 20160628
- International Announcement: WO2017/002782 WO 20170105
- Main IPC: G01R29/08
- IPC: G01R29/08
Abstract:
Provided is an electro-optic probe for detecting an electromagnetic wave, including: an electro-optic crystal; and an optical fiber optically coupled to the electro-optic crystal, wherein a direction of a unique axis of the electro-optic crystal and a polarization direction of light from the optical fiber that enters the electro-optic crystal are set to be in line with each other, or wherein a direction of a unique axis of the electro-optic crystal and a unique polarization direction of the optical fiber are set to be in line with each other.
Public/Granted literature
- US20180188305A1 Electro-Optic Probe, Electromagnetic Wave Measuring Apparatus, and Electromagnetic Wave Measuring Method Public/Granted day:2018-07-05
Information query
