Invention Grant
- Patent Title: Optical probe system and method
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Application No.: US15753847Application Date: 2016-08-19
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Publication No.: US10761151B2Publication Date: 2020-09-01
- Inventor: Kyoung Yang , John Whitaker
- Applicant: Advanced Fiber Sensors, Inc.
- Applicant Address: US MI Ann Arbor
- Assignee: Advanced Fiber Sensors, Inc.
- Current Assignee: Advanced Fiber Sensors, Inc.
- Current Assignee Address: US MI Ann Arbor
- Agency: Darrow Mustafa PC
- International Application: PCT/US2016/047703 WO 20160819
- International Announcement: WO2017/034948 WO 20170302
- Main IPC: G01R33/032
- IPC: G01R33/032 ; G02F1/29 ; G02B6/10 ; G02B7/18 ; G02B6/27 ; B01F13/08 ; B01F15/06 ; B01L7/00 ; B01L9/00 ; G02B23/24 ; G02B6/26

Abstract:
An optical fiber-mounted field sensor for measuring an electric or magnetic field includes an optical fiber configured to receive light from a laser source, a polarizer, a polarization manipulator, electro-optical material or magneto-optical material adjacent to the polarization manipulator, and a high reflection coating. The polarizer is adjacent to an output of the fiber, while the polarization manipulator is adjacent to the polarizer and opposite of the optical fiber. The electro-optical material or magneto-optical material is adjacent to the polarization manipulator, and the high reflection coating is adjacent to the electro-optical material or magneto-optical material. An optical mainframe for sending and receiving optical beams to and from the optical fiber-mounted field sensor is also described.
Public/Granted literature
- US20190011507A1 OPTICAL PROBE SYSTEM AND METHOD Public/Granted day:2019-01-10
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