Invention Grant
- Patent Title: Image inspection device and illumination device
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Application No.: US16188155Application Date: 2018-11-12
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Publication No.: US10761405B2Publication Date: 2020-09-01
- Inventor: Yutaka Kato
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@27f5fdb7
- Main IPC: H04N5/335
- IPC: H04N5/335 ; G03B15/02 ; G01N21/84 ; G01N21/88

Abstract:
The disclosure provides an image inspection device capable of uniformizing an irradiation solid angle of light to be radiated to each point on a target and being downsized. An image inspection device includes a photographing portion that images a target, and an illumination portion disposed between the target and the photographing portion. The illumination portion includes a surface light source, and a plurality of sets each including first to n-th optical members arranged along a light emitting surface of the surface light source. n is an integer equal to or greater than 2. The first to n-th optical members are disposed to face the light emitting surface, and transmit light emitted from the light emitting surface toward the target. Wavelengths and solid angles of light emitted from the first to n-th optical members toward the target are different from one another.
Public/Granted literature
- US20190243213A1 IMAGE INSPECTION DEVICE AND ILLUMINATION DEVICE Public/Granted day:2019-08-08
Information query