Invention Grant
- Patent Title: Inspection apparatus, inspection method and computer program product
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Application No.: US15766317Application Date: 2016-08-23
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Publication No.: US10762614B2Publication Date: 2020-09-01
- Inventor: Hiroyuki Yuyama , Hirokazu Amano
- Applicant: YUYAMA MFG. CO., LTD.
- Applicant Address: JP Toyonaka-Shi, Osaka
- Assignee: YUYAMA MFG, CO., LTD.
- Current Assignee: YUYAMA MFG, CO., LTD.
- Current Assignee Address: JP Toyonaka-Shi, Osaka
- Agency: Masuvalley & Partners
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@73cf9f30
- International Application: PCT/JP2016/074553 WO 20160823
- International Announcement: WO2017/068851 WO 20170427
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06K9/18

Abstract:
Provided is an inspection apparatus, an inspection method and a computer program product which can easily remove an improper target object. An inspection apparatus (1000) includes a base (700) for placing target objects thereon, a photographing part (100) which can photograph the target objects placed on the base (700), an inspection part for performing an inspection for the target objects placed on the base (700) based on an image photographed by the photographing part (100), and a distinguishing process part for performing a process of making a specific target object placed on the base (700) visually distinguishable from other target objects placed on the base (700) based on a result of the inspection performed by the inspection part.
Public/Granted literature
- US20180286031A1 INSPECTION APPARATUS, INSPECTION METHOD AND COMPUTER PROGRAM PRODUCT Public/Granted day:2018-10-04
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