Invention Grant
- Patent Title: Substrate processing apparatus, method of manufacturing semiconductor device, and baffle structure of the substrate processing apparatus
-
Application No.: US15873598Application Date: 2018-01-17
-
Publication No.: US10763084B2Publication Date: 2020-09-01
- Inventor: Hidehiro Yanai , Shin Hiyama , Toru Kakuda , Toshiya Shimada , Tomihiro Amano
- Applicant: HITACHI KOKUSAI ELECTRIC INC
- Applicant Address: JP Tokyo
- Assignee: KOKUSAI ELECTRIC CORPORATION
- Current Assignee: KOKUSAI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4ce10c64 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4d375b0d
- Main IPC: H01J37/32
- IPC: H01J37/32 ; G03F7/42 ; H01L21/311

Abstract:
A conventional substrate processing apparatus for generating plasma cannot generate plasma with high density and thus throughput of substrate processing is low. In order to solve this problem, provided is a substrate processing apparatus including a reaction vessel having a tubular shape and provided with a coil installed at an outer circumference thereof; a cover installed at a first end of the reaction vessel; a gas introduction port installed at the cover; a first plate installed between the gas introduction port and an upper end of the coil; a second plate installed between the first plate and the upper end of the coil; a substrate processing chamber installed at a second end of the reaction vessel; and a gas exhaust part connected to the substrate processing chamber.
Public/Granted literature
Information query