Invention Grant
- Patent Title: Inspection device and production management method
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Application No.: US16309429Application Date: 2017-04-28
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Publication No.: US10766654B2Publication Date: 2020-09-08
- Inventor: Yoichi Suzuki , Toshikazu Kawado , Chisa Inaka , Tatsuya Okada
- Applicant: KYODO YUSHI CO., LTD. , TORAY ENGINEERING CO., LTD.
- Applicant Address: JP Fujisawa-shi, Kanagawa JP Tokyo
- Assignee: KYODO YUSHI CO., LTD.,TORAY ENGINEERING CO., LTD.
- Current Assignee: KYODO YUSHI CO., LTD.,TORAY ENGINEERING CO., LTD.
- Current Assignee Address: JP Fujisawa-shi, Kanagawa JP Tokyo
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2c466a98
- International Application: PCT/JP2017/017010 WO 20170428
- International Announcement: WO2017/217127 WO 20171221
- Main IPC: G01N21/88
- IPC: G01N21/88 ; B65B57/00 ; G01N21/64 ; G01N21/94 ; G01N21/90 ; B65B55/22 ; G05B19/418

Abstract:
An inspection device (1) includes a light source (10) projecting excitation light to an inner surface of a container (20); an imager (11) capturing a fluorescence image of fluorescence emitted from a foreign substance in response to the excitation light projected; and a detector (13) detecting the foreign substance adhering to the inner surface of the container from the fluorescence image captured by the imager. The foreign substance contains a material emitting fluorescence in response to the excitation light projected to the material. The detector includes a calculator (14) calculating an average brightness value in an inspection target region, and an adjuster (15) adjusting an image-capturing condition where the fluorescence image is captured such that the average brightness value falls within a preset range.
Public/Granted literature
- US20190308762A1 INSPECTION DEVICE AND PRODUCTION MANAGEMENT METHOD Public/Granted day:2019-10-10
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