Invention Grant
- Patent Title: Particle collecting apparatus and particle collecting system
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Application No.: US15719178Application Date: 2017-09-28
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Publication No.: US10768089B2Publication Date: 2020-09-08
- Inventor: Toshihiko Kikuchi , Nobuyuki Nagayama , Hikaru Kikuchi , Katsushi Abe
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7437339f
- Main IPC: G01N15/10
- IPC: G01N15/10 ; G01N33/00 ; H01L21/67 ; G01N15/06 ; H01L21/683 ; G01N15/00

Abstract:
A particle collecting apparatus includes a cylindrical housing, a gap forming unit, a supply port and an intake port. The cylindrical housing has a closed top and an open bottom facing a target object. The gap forming unit is configured to form a gap having a predetermined distance between the bottom and the target object. The supply port is formed at the opening of the bottom in an annular shape along an inner wall of the housing and configured to supply a gas to the target object. The intake port is provided closer to a central axis of the supply port than the supply port and configured to suck particles on the target object.
Public/Granted literature
- US20180095021A1 PARTICLE COLLECTING APPARATUS, PARTICLE COLLECTING METHOD, AND PARTICLE COLLECTING SYSTEM Public/Granted day:2018-04-05
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