- Patent Title: Automatic analysis device and specimen inspection automation system
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Application No.: US15743332Application Date: 2016-06-15
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Publication No.: US10768187B2Publication Date: 2020-09-08
- Inventor: Kenichi Yasuzawa , Tsuguhiko Sato , Hiroki Mori
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@29f1c426
- International Application: PCT/JP2016/067784 WO 20160615
- International Announcement: WO2017/033537 WO 20170302
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N15/06 ; G01N35/02 ; B01F15/00 ; G05B23/02

Abstract:
In order to easily identify a specimen to be extracted because, for example, an item remains uninspected, from a rack 31 collected in a storage part 13 or the rack 31 taken out from the storage part, a camera of a smart device takes an image of the rack; and a calculation unit included in the smart device provides a mark, by AR technology, at the position of a specimen to be extracted. For example, the item that remains uninspected is identified on the basis of information about a combination of a rack ID and an identifier and information, which is received from an operation unit about specimens at respective positions. Thus, irrespective of a place or whether the specimen to be extracted is inside or outside of the device, the specimen to be extracted can be reliably specified from a plurality of specimen containers provided on a holder.
Public/Granted literature
- US20180203027A1 AUTOMATIC ANALYSIS DEVICE AND SPECIMEN INSPECTION AUTOMATION SYSTEM Public/Granted day:2018-07-19
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