Invention Grant
- Patent Title: Method for using a geometrical probe with a spindle of a machine tool, and machine tool configured to carry out such a method
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Application No.: US16101884Application Date: 2018-08-13
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Publication No.: US10768604B2Publication Date: 2020-09-08
- Inventor: Jonas Meier , Jean-Philippe Besuchet , Kurt Schneider
- Applicant: Mikron Agie Charmilles AG
- Applicant Address: CH
- Assignee: GF MACHINING SOLUTIONS AG
- Current Assignee: GF MACHINING SOLUTIONS AG
- Current Assignee Address: CH
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3eeae8e1
- Main IPC: G05B19/404
- IPC: G05B19/404 ; G05B19/4065 ; B23Q17/09 ; G01B11/00 ; G05B19/406
Abstract:
A method for using a geometrical probe (5) with a spindle (3) of a machine tool (1), wherein a probe fetch waiting state of the machine tool (1), at least one temperature parameter related to a temperature of the spindle (3) of the machine tool (1) is determined by measuring at least one temperature value for the spindle (3), and time for fetching the geometrical probe (5) is determined depending on the at least one temperature parameter.
Public/Granted literature
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