A batch automatic test method and a batch automatic test device for solid state disks are provided. The batch automatic test method is used for testing a plurality of solid state disks by a batch automatic test device. The solid state disks are coupled to the batch automatic test device. The batch automatic test method includes the following steps. A plurality of buses of the batch automatic test device are scanned to mark the solid state disks and a system disk. A piece of disk information of each of the solid state disks is shown. Each of the pieces of the disk information includes a disk location of each of the solid state disks. A formatting procedure is synchronously performed on the solid state disks according to the disk locations. After performing the formatting procedure, a burn-in test procedure is automatically and synchronously performed on the solid state disks.