Inspection device including processor configured to execute process, the process including: making accept/reject testing on inspection image through first image inspection program in group of image inspection programs including plurality of learning-type image inspection programs of different generations, each of which satisfies predetermined standard of fitness of the image inspection program with respect to learning image; and replacing the first image inspection program with second image inspection program in the group of image inspection programs which exhibits optimum fitness with respect to the misrecognized inspection image, when operator makes the accept/reject testing on the inspection image that has undergone the accept/reject testing through the first image inspection program and finds the misrecognized inspection image.