- Patent Title: Apparatuses and methods for maintaining a duty cycle error counter
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Application No.: US16557933Application Date: 2019-08-30
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Publication No.: US10770130B2Publication Date: 2020-09-08
- Inventor: Yasuo Satoh , Tyler J. Gomm
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C11/4076
- IPC: G11C11/4076 ; H03K3/017 ; H03K23/00 ; H03M7/16 ; G11C29/02 ; H03K5/156 ; G11C7/22 ; H03K19/21

Abstract:
Apparatuses and methods for maintaining a duty cycle error counter. An example apparatus may a duty cycle detect circuit configured to receive a clock signal and to detect a duty cycle error of the clock signal. The duty cycle detect error includes a counter configured to store a count value indicating the duty cycle error using Gray code. The counter is adjusted in response to detection of non-zero duty cycle error, and the counter is configured to convert the count value from Gray code to binary code as a binary count value. The duty cycle detect circuit is further configured to provide a duty cycle error signal based on the binary count value. The example apparatus further comprising a duty cycle correction circuit configured to adjust a duty cycle of the clock signal based on the duty cycle error signal.
Public/Granted literature
- US20200005855A1 APPARATUSES AND METHODS FOR MAINTAINING A DUTY CYCLE ERROR COUNTER Public/Granted day:2020-01-02
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