Invention Grant
- Patent Title: Critical dimension control for self-aligned contact patterning
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Application No.: US15902362Application Date: 2018-02-22
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Publication No.: US10770349B2Publication Date: 2020-09-08
- Inventor: Abhijit Basu Mallick , Ziqing Duan
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Servilla Whitney LLC
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/285 ; H01L21/02 ; H01L21/311

Abstract:
Processing methods to create self-aligned contacts are described. A conformal liner can be deposited in a feature in a substrate surface leaving a gap between the walls of the liner. A tungsten film can be deposited in the gap of the liner and volumetrically expanded. The expanded film can be removed and replaced with a contact material to a make a contact. In some embodiments, a conformal tungsten film can be formed in the feature leaving a gap between the walls. A dielectric can be deposited in the gap and the conformal tungsten film can be volumetrically expanded to grow two pillars. The pillars can be removed and replaced with a contact material to make two contacts.
Public/Granted literature
- US20180240706A1 Critical Dimension Control For Self-Aligned Contact Patterning Public/Granted day:2018-08-23
Information query
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