Invention Grant
- Patent Title: FinFET with dummy fins and methods of making the same
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Application No.: US16261307Application Date: 2019-01-29
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Publication No.: US10770571B2Publication Date: 2020-09-08
- Inventor: Chun-Hao Hsu , Yu-Chun Ko , Yu-Chang Liang , Kao-Ting Lai
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/3105 ; H01L21/02 ; H01L29/78

Abstract:
A semiconductor structure includes semiconductor fins protruding out of a substrate, dielectric fins protruding out of the substrate and disposed among the semiconductor fins, and gate stacks disposed over the semiconductor fins and the dielectric fins. The dielectric fins include a first dielectric material layer, a second dielectric material layer disposed over the first dielectric material layer, and a third dielectric material layer disposed over the second dielectric material layer, where the first and second dielectric material layers have different compositions and the first and the third dielectric material layers have the same compositions.
Public/Granted literature
- US20200091311A1 FinFET with Dummy Fins and Methods of Making the Same Public/Granted day:2020-03-19
Information query
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