Invention Grant
- Patent Title: Thermal conductivity measurement device and thermal conductivity measurement method
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Application No.: US16461594Application Date: 2017-12-27
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Publication No.: US10775329B2Publication Date: 2020-09-15
- Inventor: Haruna Tada , Yasuyuki Sanda , Dai Nakajima
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@629752c6
- International Application: PCT/JP2017/046879 WO 20171227
- International Announcement: WO2018/131482 WO 20180719
- Main IPC: G01N25/18
- IPC: G01N25/18 ; G01K7/02 ; G01K1/00 ; G01K13/00

Abstract:
A thermal conductivity measurement device comprises: first and second clamping members which clamp an object; a heating member which has a contacting end surface which contacts a distal end surface of the first clamping member through a first axial correction member, and a distal end surface on the reverse side of the contacting end surface; a cooling member which has a contacting end surface which contacts a distal end surface of the second clamping member through a second axial correction member, and a distal end surface on the reverse side of the contacting end surface; a plurality of temperature sensors disposed on the clamping members; and a mechanism which applies a pressing force between the heating member and the cooling member. At least one surface of the first axial correction member and the second axial correction member has a convex curved shape, and the other surface is a flat surface.
Public/Granted literature
- US20190369038A1 THERMAL CONDUCTIVITY MEASUREMENT DEVICE AND THERMAL CONDUCTIVITY MEASUREMENT METHOD Public/Granted day:2019-12-05
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