Invention Grant
- Patent Title: Systems and methods for duty cycle measurement, analysis, and compensation
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Application No.: US15636589Application Date: 2017-06-28
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Publication No.: US10775431B2Publication Date: 2020-09-15
- Inventor: Hitoshi Miwa
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Vierra Magen Marcus LLP
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R29/02 ; G01R25/00 ; G01R31/28 ; H03K5/26 ; G01R23/20

Abstract:
A duty cycle measurement circuit obtains differential duty cycle measurements corresponding to the duty cycle of a signal at two or more different locations along a propagation path. The differential duty cycle measurements may include measurements of an input duty cycle and measurements of an output duty cycle. The duty cycle measurements may be acquired by use of duty-cycle-to-voltage converter circuitry. The duty cycle measurements may be used to determine a measure of the duty cycle deterioration of the propagation path, and an adjustment factor to compensate for the measured duty cycle deterioration.
Public/Granted literature
- US20190004111A1 Systems and Methods for Duty Cycle Measurement, Analysis, and Compensation Public/Granted day:2019-01-03
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