Invention Grant
- Patent Title: Scanning microscope
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Application No.: US15580288Application Date: 2016-06-13
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Publication No.: US10775599B2Publication Date: 2020-09-15
- Inventor: Hilmar Gugel , Felix Neugart , Ingo Boehm
- Applicant: LEICA MICROSYSTEMS CMS GMBH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2d9b65cc
- International Application: PCT/EP2016/063509 WO 20160613
- International Announcement: WO2016/198694 WO 20161215
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B5/28

Abstract:
A scanning microscope includes an objective arranged in an illuminating beam path to focus an illuminating light bundle onto a sample. A scanning unit is arranged upstream of the objective to deflect the illuminating light bundle such that it is focused by the objective executes a scanning movement on the sample. A detection unit is arranged in a detection beam path to receive a detection light bundle not deflected by the scanning unit. For spectral influencing of the detection light bundle, the detection unit contains a spectrally selective component which has an active surface with a spectral edge which varies with the location of incidence of the detection light bundle on the active surface. The active surface is arranged in the detection beam path at the location of an image of an objective pupil, or in a position at which a variation of the spectral edge is compensated for.
Public/Granted literature
- US20180321478A1 SCANNING MICROSCOPE Public/Granted day:2018-11-08
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