Invention Grant
- Patent Title: Method for identification of candidate points as possible characteristic points of a calibration pattern within an image of the calibration pattern
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Application No.: US15779880Application Date: 2016-11-17
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Publication No.: US10776953B2Publication Date: 2020-09-15
- Inventor: Waldemar Dworakowski , Rafal Dlugosz , Krzysztof Gongolewski
- Applicant: Aptiv Technologies Limited
- Applicant Address: BB St. Michael
- Assignee: Aptiv Technologies Limited
- Current Assignee: Aptiv Technologies Limited
- Current Assignee Address: BB St. Michael
- Agency: Colby Nipper PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@38dab954
- International Application: PCT/EP2016/078011 WO 20161117
- International Announcement: WO2017/093037 WO 20170608
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/80 ; G06T7/70 ; G06T7/73
Abstract:
A method for identification of candidate points as possible characteristic points of a calibration pattern within an image of the calibration pattern includes the steps of determining spots within a filtered image de-rived from the image of the calibration pattern, with a spot being defined as a coherent set of pixels of the filtered image having pixel values exceeding a threshold; for each determined spot, calculating a central point of the determined spot; and identifying as candidate points all calculated central points.
Public/Granted literature
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