Invention Grant
- Patent Title: Array substrate, testing method and display apparatus
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Application No.: US15744421Application Date: 2017-11-25
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Publication No.: US10777107B2Publication Date: 2020-09-15
- Inventor: Ronglei Dai
- Applicant: Wuhan China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Wuhan
- Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Wuhan
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6063951b
- International Application: PCT/CN2017/112986 WO 20171125
- International Announcement: WO2019/085098 WO 20190509
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/36

Abstract:
Embodiments of the present application provides an array substrate, testing method and display apparatus. The array substrate comprises a testing circuit, pixel units and data lines connecting to the pixel units. The data lines are used for providing data signals to the pixel units and are arranged to extend along a first direction. The testing circuit comprises a switching unit and testing units. The switching unit comprises a first number of first switching elements parallelly arranged along the first direction, and the testing units are parallelly arranged along a second direction perpendicular to the first direction. By using the present application, performance of substrate testing can be ensured while achieving narrow boarder, and user experiences could be easily improved.
Public/Granted literature
- US20190130802A1 ARRAY SUBSTRATE, TESTING METHOD AND DISPLAY APPARATUS Public/Granted day:2019-05-02
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