• Patent Title: Phase changeable memory device and semiconductor integrated circuit device including the same
  • Application No.: US16274796
    Application Date: 2019-02-13
  • Publication No.: US10777740B2
    Publication Date: 2020-09-15
  • Inventor: Dong Yean OhChang Soo Woo
  • Applicant: SK hynix Inc.
  • Applicant Address: KR Gyeonggi-do
  • Assignee: SK hynix Inc.
  • Current Assignee: SK hynix Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3a0b98ea
  • Main IPC: H01L45/00
  • IPC: H01L45/00
Phase changeable memory device and semiconductor integrated circuit device including the same
Abstract:
A semiconductor integrated circuit device and a fabrication method thereof are disclosed. The resistive memory device includes a lower electrode, a resistive layer formed in a resistance change region on the lower electrode, an upper electrode formed on the resistive layer, and an insertion layer configured to allow a reset current path of the resistive layer, which is formed from the upper electrode to the lower electrode, to be bypassed in a direction perpendicular to or parallel to a surface of the lower electrode.
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