A single point to modify a behavior of intelligent electronic devices (IEDs) between active and testing modes is disclosed herein. The IED may include a variety of logical nodes, each with a behavior object related to the active or testing mode behavior of the IED. A single testing mode selection point of the IED is used to modify each of the logical nodes to change between active and testing modes. The testing mode selection point may be a logical input. The testing mode selection point may be a physical switch on the IED.