Disclosed is a backlight test circuit including N circuit blocks. Each circuit block includes M mini-LED circuits, and each mini-LED circuit includes L mini-LEDs and a switching circuit. The L mini-LEDs are connected in parallel or in serial as a mini-LED set. The switching circuit controls the turning on and the turning off of the mini-LED set according to a control signal. N, M and L are positive integers. During a backlight test, in each circuit block, at least one of the mini-LED sets is turned on. By using this backlight test circuit, the abnormal mini-LED circuit can be found. Thus, a producer can only execute a rework process for the abnormal mini-LED circuit without extra cost.