Invention Grant
- Patent Title: Synchronized noise measurement system
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Application No.: US15388903Application Date: 2016-12-22
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Publication No.: US10782337B2Publication Date: 2020-09-22
- Inventor: Zhihong Liu
- Applicant: ProPlus Design Solutions, Inc.
- Applicant Address: CN Jinan, Shandong Province
- Assignee: Jinan ProPlus Electronics Co., Ltd.
- Current Assignee: Jinan ProPlus Electronics Co., Ltd.
- Current Assignee Address: CN Jinan, Shandong Province
- Agency: Silicon Valley Patent Group LLP
- Agent Thomas C. Chan
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/28 ; G01R29/26

Abstract:
Embodiments of apparatuses of a synchronized noise measurement system and methods for using the same are disclosed. In one embodiment, a method of performing noise measurement includes setting up a plurality of device under tests (DUTs), performing noise measurement of the plurality of DUTs synchronously using programmable testing parameters to generate a noise measurement data, collecting the noise measurement data from the plurality of DUTs in parallel, and analyzing the noise measurement data collected to identify deviations in noise performance caused by manufacturing process variations or environmental variations for the plurality of DUTs.
Public/Granted literature
- US20180180662A1 Synchronized Noise Measurement System Public/Granted day:2018-06-28
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