Invention Grant
- Patent Title: Enhanced fault detection of latched data
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Application No.: US16252674Application Date: 2019-01-20
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Publication No.: US10782346B2Publication Date: 2020-09-22
- Inventor: Jose Flores , Rama Venkatasubramanian
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ebby Abraham; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; H03K3/037 ; G01R31/317 ; H03K19/21

Abstract:
In described examples, a latch includes active feedback circuitry for latching input information. A comparison of logic states between input and output states at selected times can determine whether, for example, the latch has correctly retained latch data. The latch can optionally be included within a scan chain, provide asynchronous latch error notifications, and/or synchronous notifications indicating where in the scan chain a latch error occurred.
Public/Granted literature
- US20200233030A1 ENHANCED FAULT DETECTION OF LATCHED DATA Public/Granted day:2020-07-23
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