Invention Grant
- Patent Title: MM-wave SFCW radar and SAF based imaging inspection system
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Application No.: US15864103Application Date: 2018-01-08
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Publication No.: US10782404B2Publication Date: 2020-09-22
- Inventor: Safieddin Safavi-Naeini , Shahed Shahir
- Applicant: OZ Optics Ltd.
- Applicant Address: CA Ottawa
- Assignee: OZ Optics Limited
- Current Assignee: OZ Optics Limited
- Current Assignee Address: CA Ottawa
- Agency: Hoffmann & Baron, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6dee76fc
- Main IPC: G01S13/88
- IPC: G01S13/88 ; G01S13/90 ; G01S13/38 ; G01S13/02 ; G01V8/00

Abstract:
The present invention presents a flexible, stepped frequency, radar based, imaging inspection system. The imaging inspection system can be used in airports, seaport sites, borders, postal processing centres, and sensitive sites. It comprises a millimetre-wave Stepped Frequency Continuous Wave (SFCW) radar module (2) connected to a transmitting channel and a receiving channel. The transmitting channel may comprise a frequency upconvertor (8) and the receiving channel may comprise a frequency downconvertor (10). A digital signal processing unit (14) reconstructs a conductivity profile and a permittivity profile of an object under test (OUT) from measurement data collected via a phase-array antenna or a translational stage (18) based on synthetic aperture focusing (SAF).
Public/Granted literature
- US20180196134A1 MM-WAVE SFCW RADAR AND SAF BASED IMAGING INSPECTION SYSTEM Public/Granted day:2018-07-12
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