Technology for obtaining formation parameters of a geological formation includes measuring a resistivity image of the geological formation. The measured resistivity image is compared to a modelled resistivity image where the modelled resistivity image is generated based on estimated formation parameters. A cost function is calculated based on the measure resistivity image and the modelled resistivity image. The estimated formation parameters are adjusted based on minimizing the cost function in order to generate a set of final formation parameters that represents a modelled resistivity image having a smallest cost function.