Invention Grant
- Patent Title: Multiple three-dimensional (3-D) inspection renderings
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Application No.: US15496162Application Date: 2017-04-25
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Publication No.: US10782441B2Publication Date: 2020-09-22
- Inventor: Kevin Brennan , William Davidson , Patrick Splinter
- Applicant: Analogic Corporation
- Applicant Address: US MA Peabody
- Assignee: Analogic Corporation
- Current Assignee: Analogic Corporation
- Current Assignee Address: US MA Peabody
- Agency: TraskBritt
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G06T19/00 ; G06T11/00

Abstract:
An X-ray inspection system includes at least one display monitor and a console. The console includes at least two different visualization algorithms and a processor. The processor is configured to process volumetric image data with a first of the at least two different visualization algorithms and produce a first processed volumetric image. The processor is further configured to process the volumetric image data with a second of the at least two different visualization algorithms and produce a second processed volumetric image. The processor is further configured to concurrently display the first and second processed volumetric image data via the display monitor. The volumetric image data is indicative of a scanned object and items therein.
Public/Granted literature
- US20180308255A1 Multiple Three-Dimensional (3-D) Inspection Renderings Public/Granted day:2018-10-25
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