Invention Grant
- Patent Title: System and method for automatically testing voltage regulators
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Application No.: US16001891Application Date: 2018-06-06
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Publication No.: US10782718B2Publication Date: 2020-09-22
- Inventor: Wangmiao Hu , Lijie Jiang , Qian Ouyang , Qingqing Zheng , Binci Xu , Jinghai Zhou , Eric Yang
- Applicant: Hangzhou MPS Semiconductor Technology Ltd.
- Applicant Address: CN Hangzhou
- Assignee: Hangzhou MPS Semiconductor Technology Ltd.
- Current Assignee: Hangzhou MPS Semiconductor Technology Ltd.
- Current Assignee Address: CN Hangzhou
- Agency: Perkins Coie LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5e3af08e
- Main IPC: G05F1/575
- IPC: G05F1/575 ; G01R31/40 ; G06F17/50 ; G06F1/26 ; G05B19/042 ; H02M3/157 ; G06F30/367

Abstract:
A method for automatically testing a voltage regulator, including: providing an auto-test setting to a test master, wherein the auto-test setting specifies an auto-sweep setting and a loop comprising an ordered set of serial command frames; producing, in the test master, a test suite comprising a plurality of serial command frames by executing the loop multiple times according to the auto-sweep setting until an array of a preset variable corresponding to the auto-sweep setting is traversed, wherein the preset variable is changed in each iteration of the loop; sequentially transmitting every serial command frame to the voltage regulator; and receiving every resulting behavior of the voltage regulator when operated in accordance with the every serial command frame.
Public/Granted literature
- US20180356848A1 SYSTEM AND METHOD FOR AUTOMATICALLY TESTING VOLTAGE REGULATORS Public/Granted day:2018-12-13
Information query
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