Disclosed are methods, systems, and articles of manufacture for determining layout equivalence between a plurality of versions of a single layout of a multi-fabric electronic design. These techniques identify a first version and a second version of a layout of an electronic design that spans across multiple design fabrics. One or more collaborative comparator modules are executed to determine whether the first version is identical to or different from the second version of the layout. These techniques further modify the first version or the second version of the layout with discrepancy annotation.