Integrated resistive processing unit to avoid abrupt set of RRAM and abrupt reset of PCM
Abstract:
A method is presented for forming a cell structure. The method includes constructing a resistive random access memory (RRAM) device, constructing a phase change memory (PCM) device in series with the RRAM device such that one of the electrodes of the PCM device is connected to a reactive electrode of the RRAM device, and connecting a complementary metal oxide semiconductor (CMOS) inverter to the RRAM and PCM devices to individually control switching behaviors of the RRAM and PCM devices.
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