Invention Grant
- Patent Title: Tamper evident bag
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Application No.: US15884664Application Date: 2018-01-31
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Publication No.: US10793335B2Publication Date: 2020-10-06
- Inventor: Sumei Lin , Li-yung Chang , Ben Tseng
- Applicant: Inteplast Group Corporation
- Applicant Address: US NJ Livingston
- Assignee: Inteplast Group Corporation
- Current Assignee: Inteplast Group Corporation
- Current Assignee Address: US NJ Livingston
- Agency: Stinson LLP
- Main IPC: B65D77/30
- IPC: B65D77/30 ; B65D33/08 ; B65D77/12 ; B65D33/01 ; B65D33/18

Abstract:
A tamper evident bag has front and rear panels connected together along opposite first and second side edge margins and a bottom edge margins that define a bag interior and a first bag opening therebetween. The front and rear panels each have a tear line with a first end and a second end, the first and second ends being located at the first side edge margin. The first and second ends of each tear line being spaced part. The tear lines extend over the front and rear panels but remain spaced from the second side edge margin. Each tear line defines a respective tear out section on the front and rear panels. The tear out sections are joined along the first side edge margin and are configured to be removed to create a second bag opening.
Public/Granted literature
- US20190233191A1 TAMPER EVIDENT BAG Public/Granted day:2019-08-01
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