Invention Grant
- Patent Title: Shape measurement system and shape measurement method
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Application No.: US15928693Application Date: 2018-03-22
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Publication No.: US10794687B2Publication Date: 2020-10-06
- Inventor: Atsushi Taniguchi , Masahiro Watanabe
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4726009d
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G06T7/62 ; G06T7/00 ; G06T7/579 ; G01N21/954

Abstract:
Provided are a system and a method capable of accurately measuring consecutive shapes of a measurement target even when an imaging means, which captures images of the shape of the measurement target, is moved along the measurement target while irradiating the measurement target with light. The present invention comprises a light source, an irradiating body which irradiates the measurement object with light from the light source, an imaging body which captures images of the measurement object based on the light from the irradiating body with which the measurement object was irradiated, a moving mechanism which causes the irradiating body and the imaging body to move along the measurement object, and a processing unit which executes data processing for measuring the shape of the measurement object based on images of the measurement object, wherein the imaging body incorporates an image of the measurement object at each predetermined timing upon moving along the measurement object, and wherein processing unit determines a cross section shape of the measurement object and a moving mode of the moving mechanism based on images of the measurement object, and measures the shape of the measurement object based on the cross section shape and the moving mode.
Public/Granted literature
- US20180306573A1 Shape Measurement System and Shape Measurement Method Public/Granted day:2018-10-25
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